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"Sensitivity analysis in economics based test strategy planning."

J. H. Dick et al. (1994)

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DOI: 10.1007/BF00972083

access: closed

type: Journal Article

metadata version: 2020-09-11

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J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler:
Sensitivity analysis in economics based test strategy planning. J. Electron. Test. 5(2-3): 239-251 (1994)

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