"On-Chip Delay Measurement Based Response Analysis for Timing Characterization."

Ramyanshu Datta et al. (2010)

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DOI: 10.1007/S10836-010-5188-1

access: closed

type: Journal Article

metadata version: 2024-10-06

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Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham:
On-Chip Delay Measurement Based Response Analysis for Timing Characterization. J. Electron. Test. 26(6): 599-619 (2010)

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