"Structural Test and Diagnosis for Graceful Degradation of NoC Switches."

Atefe Dalirsani et al. (2012)

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DOI: 10.1007/S10836-012-5329-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test and Diagnosis for Graceful Degradation of NoC Switches. J. Electron. Test. 28(6): 831-841 (2012)

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