"Analog Circuit Test Point Selection Incorporating Discretization-Based ..."

Yiqian Cui, Junyou Shi, Zili Wang (2016)

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DOI: 10.1007/S10836-016-5620-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yiqian Cui, Junyou Shi, Zili Wang:
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances. J. Electron. Test. 32(6): 661-679 (2016)

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