"Fast Anti-Random (FAR) Test Generation to Improve the Quality of ..."

Tom Chen et al. (2002)

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DOI: 10.1023/A:1020844805564

access: closed

type: Journal Article

metadata version: 2021-01-20

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Tom Chen, Andre Bai, Amjad Hajjar, Anneliese Amschler Andrews, Charles Anderson:
Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification. J. Electron. Test. 18(6): 583-594 (2002)

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