"Scaling of i_DDT Test Methods for Random Logic Circuits."

Ali Chehab, Saurabh Patel, Rafic Z. Makki (2006)

> Home

Details and statistics

DOI: 10.1007/S10836-006-4835-Z

access: closed

type: Journal Article

metadata version: 2023-03-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/ChehabPM06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/ChehabPM06
Ali Chehab, Saurabh Patel, Rafic Z. Makki:
Scaling of i_DDT Test Methods for Random Logic Circuits. J. Electron. Test. 22(1): 11-22 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.