"A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback ..."

Pradeep Kumar Biswal (2023)

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DOI: 10.1007/S10836-023-06066-7

access: closed

type: Journal Article

metadata version: 2023-08-18

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Pradeep Kumar Biswal:
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits. J. Electron. Test. 39(3): 323-346 (2023)

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