"Synchronous Full-Scan for Asynchronous Handshake Circuits."

Frank te Beest et al. (2003)

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DOI: 10.1023/A:1024687809014

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/BeestPBK03
Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff:
Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electron. Test. 19(4): 397-406 (2003)

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