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"An Integrated Approach to Testing Embedded Cores and Interconnects Using ..."

Subhayu Basu et al. (2002)

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DOI: 10.1023/A:1016549725661

access: closed

type: Journal Article

metadata version: 2020-09-11

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Subhayu Basu, Indranil Sengupta, Dipanwita Roy Chowdhury, Sudipta Bhawmik:
An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch. J. Electron. Test. 18(4-5): 475-485 (2002)

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