"Testability analysis and fault modeling of BiCMOS circuits."

Dhamin Al-Khalili, Côme Rozon, B. Stewart (1992)

> Home

Details and statistics

DOI: 10.1007/BF00134731

access: closed

type: Journal Article

metadata version: 2021-01-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/Al-KhaliliRS92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/Al-KhaliliRS92
Dhamin Al-Khalili, Côme Rozon, B. Stewart:
Testability analysis and fault modeling of BiCMOS circuits. J. Electron. Test. 3(3): 207-217 (1992)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.