"A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault ..."

Badar-ud-din Ahmed et al. (2012)

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DOI: 10.1007/S10836-012-5311-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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Badar-ud-din Ahmed, Youren Wang, Rizwan Ullah, Najam-ud-din Ahmed:
A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection. J. Electron. Test. 28(4): 535-540 (2012)

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