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"A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D ..."

Nima Aghaee, Zebo Peng, Petru Eles (2015)

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DOI: 10.1007/S10836-015-5541-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Nima Aghaee, Zebo Peng, Petru Eles:
A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs. J. Electron. Test. 31(5-6): 503-523 (2015)

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