"A system for identifying an anti-counterfeiting pattern based on the ..."

Zhaohui Zheng et al. (2021)

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DOI: 10.1016/J.ESWA.2021.115410

access: closed

type: Journal Article

metadata version: 2024-11-11

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Zhaohui Zheng, Hong Zheng, Jianping Ju, Deng Chen, Xi Li, Zhongyuan Guo, Changhui You, Mingyu Lin:
A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions. Expert Syst. Appl. 183: 115410 (2021)

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