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"Automatic detection of surface defects based on deep random chains."
Tan Zhang et al. (2023)
- Tan Zhang, Zihe Wang, Fengwei Li, Haoyang Zhong, Xuejuan Hu, Wenjun Zhang, Dan Zhang, Xiaoxu Liu:
Automatic detection of surface defects based on deep random chains. Expert Syst. Appl. 229(Part A): 120472 (2023)
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