"Improving the OEE and UPH data quality by Automated Data Collection for ..."

Tai-Yue Wang, Hsiao-Chun Pan (2011)

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DOI: 10.1016/J.ESWA.2010.10.056

access: closed

type: Journal Article

metadata version: 2017-05-26

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Tai-Yue Wang, Hsiao-Chun Pan:
Improving the OEE and UPH data quality by Automated Data Collection for the semiconductor assembly industry. Expert Syst. Appl. 38(5): 5764-5773 (2011)

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