"Computer vision defect detection on unseen backgrounds for manufacturing ..."

Ahmad Mohamad Mezher, Andrew E. Marble (2024)

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DOI: 10.1016/J.ESWA.2023.122749

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type: Journal Article

metadata version: 2024-05-31

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Ahmad Mohamad Mezher, Andrew E. Marble:
Computer vision defect detection on unseen backgrounds for manufacturing inspection. Expert Syst. Appl. 243: 122749 (2024)

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