"Automated defect inspection of light-emitting diode chips using neural ..."

Hong-Dar Lin (2009)

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DOI: 10.1016/J.ESWA.2007.09.014

access: closed

type: Journal Article

metadata version: 2017-06-06

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Hong-Dar Lin:
Automated defect inspection of light-emitting diode chips using neural network and statistical approaches. Expert Syst. Appl. 36(1): 219-226 (2009)

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