"User profiling via application usage pattern on digital devices for ..."

Hongkyun Kwon, Sangjin Lee, Doowon Jeong (2021)

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DOI: 10.1016/J.ESWA.2020.114488

access: closed

type: Journal Article

metadata version: 2023-08-28

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Hongkyun Kwon, Sangjin Lee, Doowon Jeong:
User profiling via application usage pattern on digital devices for digital forensics. Expert Syst. Appl. 168: 114488 (2021)

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