"The application of control chart for defects and defect clustering in IC ..."

Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang (2007)

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DOI: 10.1016/J.ESWA.2006.01.050

access: closed

type: Journal Article

metadata version: 2017-05-26

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Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang:
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory. Expert Syst. Appl. 32(3): 765-776 (2007)

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