"A novel manufacturing defect detection method using association rule ..."

Wei-Chou Chen, Shian-Shyong Tseng, Ching-Yao Wang (2005)

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DOI: 10.1016/J.ESWA.2005.06.004

access: closed

type: Journal Article

metadata version: 2017-05-26

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Wei-Chou Chen, Shian-Shyong Tseng, Ching-Yao Wang:
A novel manufacturing defect detection method using association rule mining techniques. Expert Syst. Appl. 29(4): 807-815 (2005)

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