"Detecting technological maturity from bibliometric patterns."

Katherine Cauthen et al. (2022)

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DOI: 10.1016/J.ESWA.2022.117177

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type: Journal Article

metadata version: 2024-10-06

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Katherine Cauthen, Prashant Rai, Nicholas Hale, Laura J. Freeman, Jaideep Ray:
Detecting technological maturity from bibliometric patterns. Expert Syst. Appl. 201: 117177 (2022)

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