"Benchmarking of Standard-Cell Based Memories in the Sub- VT ..."

Pascal Andreas Meinerzhagen et al. (2011)

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DOI: 10.1109/JETCAS.2011.2162159

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type: Journal Article

metadata version: 2024-05-07

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Pascal Andreas Meinerzhagen, S. M. Yasser Sherazi, Andreas Peter Burg, Joachim Neves Rodrigues:
Benchmarking of Standard-Cell Based Memories in the Sub- V_T Domain in 65-nm CMOS Technology. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(2): 173-182 (2011)

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