"On the relative value of cross-company and within-company data for defect ..."

Burak Turhan et al. (2009)

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DOI: 10.1007/S10664-008-9103-7

access: closed

type: Journal Article

metadata version: 2024-02-05

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Burak Turhan, Tim Menzies, Ayse Basar Bener, Justin S. Di Stefano:
On the relative value of cross-company and within-company data for defect prediction. Empir. Softw. Eng. 14(5): 540-578 (2009)

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