"Random permutation-based linear regression for cancelable biometrics."

Onkar Singh et al. (2025)

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DOI: 10.1111/EXSY.13652

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type: Journal Article

metadata version: 2025-02-14

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Onkar Singh, Ajay Jaiswal, Nitin Kumar, Naveen Kumar:
Random permutation-based linear regression for cancelable biometrics. Expert Syst. J. Knowl. Eng. 42(2) (2025)

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