"An enhanced method for surface defect detection in workpieces based on ..."

Junlin Qiu et al. (2025)

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DOI: 10.1111/EXSY.13567

access: closed

type: Journal Article

metadata version: 2025-01-02

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  - https://dblp.org/rec/journals/es/QiuSLQYLL25
Junlin Qiu, Yongshan Shen, Jianchu Lin, Yuxin Qin, Jian Yang, Hengdan Lei, Minghui Li:
An enhanced method for surface defect detection in workpieces based on improved MobileNetV2-SSD. Expert Syst. J. Knowl. Eng. 42(1) (2025)

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