"Random effects model for credit rating transitions."

Yoonseong Kim, So Young Sohn (2008)

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DOI: 10.1016/J.EJOR.2006.12.007

access: closed

type: Journal Article

metadata version: 2020-02-21

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Yoonseong Kim, So Young Sohn:
Random effects model for credit rating transitions. Eur. J. Oper. Res. 184(2): 561-573 (2008)

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