"Likelihood-ratio test for technological differences in two-stage data ..."

Kai Du, Valentin Zelenyuk (2025)

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DOI: 10.1016/J.EJOR.2024.09.039

access: closed

type: Journal Article

metadata version: 2024-12-22

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Kai Du, Valentin Zelenyuk:
Likelihood-ratio test for technological differences in two-stage data envelopment analysis for panel data. Eur. J. Oper. Res. 321(2): 644-663 (2025)

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