"Detecting Common Errors in Event-Driven Process Chains by Label Analysis."

Volker Gruhn, Ralf Laue (2011)

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DOI: 10.18417/EMISA.6.1.1

access: open

type: Journal Article

metadata version: 2020-03-06

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Volker Gruhn, Ralf Laue:
Detecting Common Errors in Event-Driven Process Chains by Label Analysis. Enterp. Model. Inf. Syst. Archit. Int. J. Concept. Model. 6(1): 3-15 (2011)

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