"Investigating the reliability of second-order formative measurement in ..."

Bongsik Shin, Gimun Kim (2011)

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DOI: 10.1057/EJIS.2011.7

access: closed

type: Journal Article

metadata version: 2020-03-13

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Bongsik Shin, Gimun Kim:
Investigating the reliability of second-order formative measurement in information systems research. Eur. J. Inf. Syst. 20(5): 608-623 (2011)

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