"Improving reliability of non-volatile memory technologies through circuit ..."

Chengen Yang et al. (2012)

> Home

Details and statistics

DOI: 10.1186/1687-6180-2012-211

access: open

type: Journal Article

metadata version: 2021-04-09

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ejasp/YangECC12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ejasp/YangECC12
Chengen Yang, Yunus Emre, Yu Cao, Chaitali Chakrabarti:
Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding. EURASIP J. Adv. Signal Process. 2012: 211 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.