"Blackbox identity testing for bounded top fanin depth-3 circuits: the ..."

Nitin Saxena, C. Seshadhri (2010)

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type: Informal or Other Publication

metadata version: 2022-09-27

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Nitin Saxena, C. Seshadhri:
Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter. Electron. Colloquium Comput. Complex. TR10 (2010)

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