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"Hardness vs Randomness, Revised: Uniform, Non-Black-Box, and Instance-Wise."
Lijie Chen, Roei Tell (2021)
- Lijie Chen, Roei Tell:
Hardness vs Randomness, Revised: Uniform, Non-Black-Box, and Instance-Wise. Electron. Colloquium Comput. Complex. TR21 (2021)

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