"Randomized Polynomial Time Identity Testing for Noncommutative Circuits."

Vikraman Arvind, Partha Mukhopadhyay, Raja S (2016)

> Home

Details and statistics

DOI: —

access: open

type: Informal or Other Publication

metadata version: 2023-06-02

- view
  - electronic edition @ weizmann.ac.il (open access)
- export record
  dblp key:
  - journals/eccc/ArvindMS16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eccc/ArvindMS16
Vikraman Arvind, Partha Mukhopadhyay, Raja S:
Randomized Polynomial Time Identity Testing for Noncommutative Circuits. Electron. Colloquium Comput. Complex. TR16 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.