"A Systematic Approach to Memory Test Time Reduction."

Jen-Chieh Yeh et al. (2008)

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DOI: 10.1109/MDT.2008.152

access: closed

type: Journal Article

metadata version: 2023-09-30

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  persistent URL:
  - https://dblp.org/rec/journals/dt/YehCWK08
Jen-Chieh Yeh, Chao-Hsun Chen, Cheng-Wen Wu, Shuo-Fen Kuo:
A Systematic Approach to Memory Test Time Reduction. IEEE Des. Test Comput. 25(6): 560-570 (2008)

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