"Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package."

Kai-Li Wang et al. (2017)

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DOI: 10.1109/MDAT.2016.2562060

access: closed

type: Journal Article

metadata version: 2023-09-30

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Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang:
Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. IEEE Des. Test 34(3): 50-58 (2017)

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