"Statistical Variability and Reliability and the Impact on Corresponding ..."

Xingsheng Wang et al. (2013)

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DOI: 10.1109/MDAT.2013.2266395

access: closed

type: Journal Article

metadata version: 2021-10-14

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Xingsheng Wang, Binjie Cheng, Jente B. Kuang, Andrew R. Brown, Campbell Millar, Asen Asenov:
Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. IEEE Des. Test 30(6): 18-28 (2013)

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