"Alpha 21164 Manufacturing Test Development and Coverage Analysis."

Carol Stolicny et al. (1998)

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DOI: 10.1109/54.706040

access: closed

type: Journal Article

metadata version: 2020-05-17

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Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong:
Alpha 21164 Manufacturing Test Development and Coverage Analysis. IEEE Des. Test Comput. 15(3): 98-104 (1998)

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