"Efficient Sequential Test Generation Based on Logic Simulation."

Shuo Sheng, Michael S. Hsiao (2002)

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DOI: 10.1109/MDT.2002.1033793

access: closed

type: Journal Article

metadata version: 2020-05-17

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Shuo Sheng, Michael S. Hsiao:
Efficient Sequential Test Generation Based on Logic Simulation. IEEE Des. Test Comput. 19(5): 56-64 (2002)

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