"Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path ..."

Ankit Shah, Raman Nayyar, Arani Sinha (2020)

> Home

Details and statistics

DOI: 10.1109/MDAT.2020.2968253

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/dt/ShahNS20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/ShahNS20
Ankit Shah, Raman Nayyar, Arani Sinha:
Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests. IEEE Des. Test 37(4): 7-13 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.