"Using Electrical Bitmap Results from Embedded Memory to Enhance Yield."

Julie Segal et al. (2001)

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DOI: 10.1109/54.922801

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/SegalJLC01
Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu:
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Des. Test Comput. 18(3): 28-39 (2001)

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