"IC Outlier Identification Using Multiple Test Metrics."

Sagar S. Sabade, Duncan M. Hank Walker (2005)

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DOI: 10.1109/MDT.2005.143

access: closed

type: Journal Article

metadata version: 2020-05-17

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Sagar S. Sabade, Duncan M. Hank Walker:
IC Outlier Identification Using Multiple Test Metrics. IEEE Des. Test Comput. 22(6): 586-595 (2005)

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