"Novel Technique for Manufacturing, System-Level, and In-System Testing of ..."

Amit Pandey et al. (2023)

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DOI: 10.1109/MDAT.2023.3269389

access: closed

type: Journal Article

metadata version: 2023-07-07

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Amit Pandey, Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, Karthikeyan Natarajan, Rahul Singhal:
Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O. IEEE Des. Test 40(4): 17-24 (2023)

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