"Identifying Systematic Failures on Semiconductor Wafers Using ADCAS."

Melanie Po-Leen Ooi et al. (2013)

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DOI: 10.1109/MDAT.2013.2253151

access: closed

type: Journal Article

metadata version: 2022-10-02

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Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan:
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Des. Test 30(5): 44-53 (2013)

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