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"Identifying Systematic Failures on Semiconductor Wafers Using ADCAS."
Melanie Po-Leen Ooi et al. (2013)
- Melanie Po-Leen Ooi
, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko
, Chris W. K. Chan:
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Des. Test 30(5): 44-53 (2013)
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