"Extracting Defect Density and Size Distributions from Product ICs."

Jeffrey E. Nelson et al. (2006)

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DOI: 10.1109/MDT.2006.117

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/NelsonZBPBMBS06
Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23(5): 390-400 (2006)

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