"On the Integration of Design and Test for Chips Embedding MEMS."

Salvador Mir, Benoît Charlot (1999)

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DOI: 10.1109/54.808204

access: closed

type: Journal Article

metadata version: 2020-05-17

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Salvador Mir, Benoît Charlot:
On the Integration of Design and Test for Chips Embedding MEMS. IEEE Des. Test Comput. 16(4): 28-38 (1999)

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