default search action
"Compact Modeling of Variation in FinFET SRAM Cells."
Darsen D. Lu et al. (2010)
- Darsen D. Lu, Chung-Hsun Lin, Ali M. Niknejad, Chenming Hu:
Compact Modeling of Variation in FinFET SRAM Cells. IEEE Des. Test Comput. 27(2): 44-50 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.