"Economic Analysis of the HOY Wireless Test Methodology."

Yu-Tsao Hsing et al. (2010)

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DOI: 10.1109/MDT.2009.96

access: closed

type: Journal Article

metadata version: 2023-09-30

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Yu-Tsao Hsing, Li-Ming Denq, Chao-Hsun Chen, Cheng-Wen Wu:
Economic Analysis of the HOY Wireless Test Methodology. IEEE Des. Test Comput. 27(3): 20-30 (2010)

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