"Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep ..."

Benoît W. Denkinger et al. (2020)

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DOI: 10.1109/MDAT.2019.2947282

access: closed

type: Journal Article

metadata version: 2020-06-16

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Benoît W. Denkinger, Flavio Ponzina, Soumya Basu, Andrea Bonetti, Szabolcs Balási, Martino Ruggiero, Miguel Peón Quirós, Davide Rossi, Andreas Burg, David Atienza:
Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices. IEEE Des. Test 37(2): 84-92 (2020)

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