"Realistic built-in self-test for static RAMs."

Rob Dekker, Frans P. M. Beenker, Loek Thijssen (1989)

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DOI: 10.1109/54.20387

access: closed

type: Journal Article

metadata version: 2021-03-01

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Rob Dekker, Frans P. M. Beenker, Loek Thijssen:
Realistic built-in self-test for static RAMs. IEEE Des. Test 6(1): 26-34 (1989)

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