"Hierarchical Test Integration Methodology for 3-D ICs."

Che-Wei Chou et al. (2015)

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DOI: 10.1109/MDAT.2015.2427257

access: closed

type: Journal Article

metadata version: 2023-10-17

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Che-Wei Chou, Jin-Fu Li, Yun-Chao Yu, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou:
Hierarchical Test Integration Methodology for 3-D ICs. IEEE Des. Test 32(4): 59-70 (2015)

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